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TTTC's Electronic Broadcasting Service |
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1st IEEE International Workshop on Automotive Reliability & Test
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SUBMISSION DEADLINE EXTENDED TO September 30
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CALL FOR PAPERS
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The ART workshop focuses exclusively on test and reliability of automotive and mission-critical electronics, including design, manufacturing, burn-in, system-level integration and in-field test, diagnosis and repair solutions, as well as architectures and methods for reliable and safe operations under different environmental conditions. With increasing system complexity, security, stringent runtime requirements for functional safety and cost constraints of a mass market the reliable operation of electronics in safety-critical domains is still a major challenge. The ART Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike. |
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Submissions must be sent in as PDF file. The Workshop prefers Full Paper submissions (of up to six pages), but also allows Extended Abstract submissions (of at least two pages). Detailed submission instructions can be found at the Workshop’s website: http://ART.tttc-events.org. All submissions will be evaluated for selection with respect to their suitability for the workshop, originality, technical soundness, and presented results. Selected submissions can be accepted for regular or poster presentation at the Workshop. The workshop will make available to all participants an Electronic Workshop Digest, which includes all material that authors are willing to provide: abstract, paper, slides, poster, etc.The best papers of the workshop will be invited for submission in IEEE Design & Test Magazine. |
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| Additional Information | |
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Yervant Zorian – General Chair Synopsys 690 East Middlefield Road Mountain View, CA 94043-4033, USA Tel.: +1 (650) 584-7120 E-mail: zorian@synopsys.com
H.-J. Wunderlich – Program Chair University of Stuttgart Pfaffenwaldring 47 D-70569 Stuttgart, Germany Tel.: +49 (0)711 685 88 391 E-mail: wu@informatik.uni-stuttgart.de |
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| Committee | |
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Organizing Committee: General Chair: Y. Zorian, Synopsys Vice Chair: D. Appello, ST Micro Program Chair: H.-J. Wunderlich, University of Stuttgart Vice Program Chair: M. Sonza Reorda, Polito Torino Special Session Chair: R. Parekhji, Texas Instruments Panel: P. Sarson, AMS Finance: S. Natarajan, Intel Publication: L. Anghel, TIMA Laboratory Publicity: P. Bernardi, Polito Torino Registration: T. McLaurin, ARM
Program Committee: (to include) C. Argyrides, AMD R. Arnold, Infineon O. Ballan, Xilinx N. Bishnoi, Globalfoundries O. Bringmann, University of Tuebingen A. Cron, Synopsys W. Dobbelaere, ON Semiconductor P. Engelke, Infineon G. Ernst, Bosch C. Eychenne, Bosch G. Georgakos, Infineon D. Gizopoulos, University of Athens M. Glaß, University of Erlangen A. Hales, Texas Instruments P. Harrod, ARM W. Kunz, University of Kaiserslautern A. Majumdar, Xilinx R. Mariani, Intel S. Mehta, Synopsys R. Montino, Elmos Semiconductor N. Mukherjee, Mentor Graphics M. Nicolaidis, TIMA Laboratory H.-C. Reuss, University of Stuttgart A. Sanghani, Intel S. Sarangi, nVidia S. Schmerler, Daimler AG R. van Rijsinge, NXP P. van Staa, Bosch H. M. von Staudt, Dialog Semiconductor R. Wagner, Bosch M. Wahl, University of Siegen |
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| For more information, visit us on the web at: ART.tttc-events.org |
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The 1st IEEE International Workshop on Automotive Reliability & Test is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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IEEE
Computer Society- Test Technology Technical Council |
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